使用多用途脉冲发生解决方案实施测试

During the design of electronic components and circuits for computers, peripherals and serial communication, pulse pattern generators are likely the first tool considered for device characterization and functional test. Dedicated pulse pattern generators offer various pulse formats such as double pulse, RZ and NRZ, and low jitter. For many applications,however, modern general-purpose arbitrary/function generators (AFGs) frequently present a very flexible,versatile and more affordable solution to generate pulses.

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