【Springer新书】Reliability of Nanoscale Circuits and Systems

Reliability of Nanoscale Circuits and Systems
Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
By Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici


    * Publisher:   Springer
    * Number Of Pages:   195
    * Publication Date:   2010-10-21
    * ISBN-10 / ASIN:   1441962166
    * ISBN-13 / EAN:   9781441962164

Product Description:
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components

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