Analog Devices RF Solutions
2015年11月10日 11:02 发布者：eechina
Offering components that cover the complete high speed and RF signal chain, Analog Devices enables design engineers to develop platform electronic test and measurement systems that have best-in-class performance and low cost of test and ownership across an ever increasing frequency range from DC to >100GHz and beyond. As the preeminent supplier of data converters, RF and microwave ICs, Analog Devices provides more than 2,000 high performance products across the entire frequency spectrum.
ADI Signal Process Diagram
A vector signal analyzer is an instrument that measures the magnitude and phase of the measured signal at a single frequency within the range of the instrument. Their primary use is to make in-channel measurements on known signals, such as code domain power, error vector magnitude, and spectral flatness. They are useful in measuring and demodulating digitally modulated signals like cellular and Wi-Fi.
Analog Devices, Inc. strengths throughout the spectrum include: ADC drivers and ADCs, DDS, and clock generation chips; ADI's PLL/VCOs and RF Switches dominate in RF instrumentation.
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Additional Resources
Technical Documents
Analog Devices RF and Microwave IC Selection Guide 2015：150904
The Impact of Clock Generator Performance on Data Converters：150915
Power Management for Integrated RF ICs：150905
Application Notes
AN-0982 The Residual Phase Noise Measurement：150914
AN-0983 Introduction to Zero-Delay Clock Timing Techniques：150913
AN-0988 The AD9552: A Programmable Crystal Oscillator for Network Clocking Applications ：150912
AN-1051 Reference Design for the AD9552 Oscillator Frequency Upconverter：150911
AN-1066 Power Supply Considerations for AD9523, AD9524, and AD9523-1 Low Noise Clocks：150910
AN-1067 The Power Spectral Density of Phase Noise and Jitter: Theory, Data Analysis, and Experimental Results ：150909
AN-1217 Clock Distribution Circuit with Pin-Programmable Output Frequency, Output Logic Levels, and Fanout：150908
AN-501 Aperture Uncertainty and ADC System Performance：150907
AN-756 Sampled Systems and the Effects of Clock Phase Noise and Jitter：150906