Semiconductor Material and Device Characterization
2014年08月04日 14:17 发布者:看门狗
This Third Edition updates a landmark text with the latest findingsThe Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.
Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques.
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jimcmwang 2019年06月03日
(John Wiley & Sons,2006)Semiconductor Material and Device Characterization(3E).pdf (12.44 MB, 下载次数: 49)
(John Wiley & Sons,2006)Semiconductor Material and Device Characterization(3E).pdf (12.44 MB, 下载次数: 49)
谢谢!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!